We want to show you the possibilities for collecting and storing measurement data for conducting fault analyses using historical data.

By integrating deliberate data collection, fault analysis becomes both more complex and more transparent.

Which systems will make our work easier in the future by collecting and processing all relevant data and then making it available at a glance? It would even be possible to obtain an initial fault analysis and troubleshooting using a suitable algorithm. The aim of this presentation is to answer the following questions:

• Where are measurement data/values ​​generated?
• Which devices generate measurement data?
• Is measurement data recorded historically, and for how long?
• Why is measurement data collected?
• Where do errors occur during data collection?
• Combining/providing monitoring data for instrumentation and control (I&C) technology
• How helpful is measurement data from I&C and monitoring for fault analysis?
• How important is this for risk consulting/assessment?